- 15 September 2006 -

Bridging the microscope gap

A new laser confocal technology has been announced by Olympus Micro-Imaging that fills the gap between conventional high resolution optical microscopes and SEMs. More.
Called LEXT, this new laser scanning confocal technology is designed for applications requiring ultra-precise measurement and observation, such as MEMs fabrication, advanced materials processing, nanoscale production, and semiconductor wafer manufacturing. The new technology, introduced in the OLS3000 LEXT micro-imaging system, features sub-micron imaging with outstanding 0.12 µm and 0.01 µm Z resolution and accurate three-dimensional measurement capability.

Olympus Micro-Imaging is also introducing the LEXT-IR, a near-infrared system operating at a wavelength of 1310 nm for nondestructive, high-resolution observation and measurement through silicon materials.

www.olympusmicroimaging.com