- 12 June 2006 -

Ultra-short pulsed IV measurements

Agilent Technologies has introduced a parametric test solution for laboratory and R&D environments that provides ultra-short pulsed IV measurements as narrow as 10ns. This makes possible extremely accurate testing of thermally or charge-sensitive devices such as silicon-on-insulator (SOI) and high-k dielectric transistors used in high-speed logic applications. Agilent will showcase its ultra-short pulsed IV solution at the Agilent Measurement Forum, June 6-9, in Shinagawa, Japan. It includes the B1500A Semiconductor Device Analyzer, an Agilent pulse generator, an Agilent digital oscilloscope, new application software and pulsed IV accessories.

http://www.agilent.com/see/B1500A