- 4 May 2006 -

Versatile tester makes its debut

The new Cascade Microtech 150 mm device measurement platform measures anything from semiconductor wafers, ICs, circuit boards and MEMS to bioscience devices, all on a single platform. The M150 Measurement Platform offers unprecedented customer flexibility to switch between applications within minutes and saves the expense of buying a new measurement station for each discrete application, the company said.

"I'm now using the M150 for failure analysis and soon plan to switch over for GaAs process characterization. With the new set platen-chuck offset and its probe options, the M150 is very easy to change for more advanced on-wafer characterization. Now we don't need two stations with two sets of probes. It's so easy to switch applications on the fly. The new platen design is especially helpful," said Corey Nevers, Technology Development, TriQuint Semiconductor, Inc.

The M150 Measurement Platform is customer configurable with interchangeable standard parts and accessories optimized for specific measurement needs. Its versatility can save customers tens of thousands of dollars on the purchase of separate measurement stations. The M150 helps customers solve device problems such as those related to power consumption, operating frequency, signal isolation, signal integrity and channel bandwidth.
Cascade Microtech says it has simplified the entire purchase process to allow a single prober to be expanded with accessories. Customers can buy a system by purchasing a prober bundle and an accessory bundle for their application of choice. Customers have the flexibility to add on new accessory bundles to later modify any of the standard bundles below. Thus, any system bundle is infinitely expandable as no one system locks in or limits the measurement capabilities of the future.

For more details, visit: www.cascademicrotech.com/m150