- 11 September 2006 -

MaxMile Technologies EpiEL probes for epiwafer mapping

MaxMile Technologies, LLC at Lexington, SC, USA, has introduced two types of EpiEL probes to meet different application needs. Both types of probes can be used in existing EpiEL probe station without any change of hardware configuration.

These are Type I EpiEL to reveal the electroluminescence (EL) characteristics of wide driving current density, and Type II EpiEL probe can be customized to a specific contact size to closely simulate the real device for each application.

Both types of probes can be used in existing EpiEL probe station without any change of hardware configuration. With these probes, MaxMile Epi-wafer Electroluminescence (EpiEL) mapping system will best meet various application requirements spanning from research and development to manufacture.

MaxMile EpiEL mapping systems provide a unique characterization solution for LED/LD industry. They characterize the EL behaviour of unprocessed light emitting materials as a finished device (such as LED) functions through EL.

www.maxmiletech.com